Abstract
The carrier mobility μ of few-layer graphene (FLG) field-effect transistors increases tenfold when the SiO2 substrate is replaced by single-crystal epitaxial Pb(Zr0.2Ti0.8)O3 (PZT). In the electron-only regime of the FLG, μ reaches 7×104cm2/Vs at 300 K for n=2.4×1012/cm2, 70% of the intrinsic limit set by longitudinal acoustic (LA) phonons; it increases to 1.4×105cm2/Vs at low temperature. The temperature-dependent resistivity ρ(T) reveals a clear signature of LA phonon scattering, yielding a deformation potential D=7.8±0.5eV.
Original language | English (US) |
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Article number | 136808 |
Journal | Physical review letters |
Volume | 102 |
Issue number | 13 |
DOIs | |
State | Published - Mar 30 2009 |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy