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High Performance
100%
Nitric Oxide
100%
Field-effect Transistors
100%
P-type
100%
Oxide Doping
100%
Bilayer WSe2
100%
Two-dimensional Fields
75%
Two Dimensional Materials
50%
On-state Current
50%
P-type Doping
50%
Materials Research
25%
Thermal Stability
25%
Two Dimensional
25%
Metal-organic Chemical Vapor Deposition (MOCVD)
25%
Contact Resistance
25%
Transconductance
25%
Gate Dielectric
25%
Complementary Metal-oxide-semiconductor Technology
25%
Promising Solutions
25%
Subthreshold Swing
25%
Chemical Vapor Deposition Processes
25%
Equivalent Oxide Thickness
25%
Channel Length
25%
Fully Integrated
25%
Temporal Stability
25%
Device Parameters
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Semiconductor Applications
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Complementary Metal Oxide Semiconductor
25%
Current Ratio
25%
Drain Voltage
25%
Engineering
Field-Effect Transistor
100%
Two Dimensional
100%
2D Material
50%
Complementary Metal-Oxide-Semiconductor
50%
Metal Organic Chemical Vapor Deposition
25%
Promising Candidate
25%
Realization
25%
Deposition Process
25%
Channel Length
25%
Oxide Thickness
25%
Gate Dielectric
25%
Drain Voltage
25%
Current Ratio
25%
Material Science
Field Effect Transistor
100%
Nitric Oxide
100%
Two-Dimensional Material
50%
Complementary Metal-Oxide-Semiconductor Device
50%
Thermal Stability
25%
Metal-Organic Chemical Vapor Deposition
25%
Oxide Compound
25%
Contact Resistance
25%
Vapor Phase Deposition
25%
Hole Mobility
25%
Dielectric Material
25%