Mathematics
Resistivity
69%
Oxides
67%
Thin Films
61%
Target
42%
Coefficient
24%
Sputtering
21%
Imaging
13%
Focal Plane Array
12%
Biased
11%
Thermal Imaging
11%
1/f Noise
10%
Electrical Properties
9%
Oxygen
7%
Camera
7%
Range of data
7%
Real-time
6%
Lateral
6%
Resistance
6%
Gas
5%
Necessary
4%
Partial
4%
Energy
4%
Microbolometer
0%
Engineering & Materials Science
Ion beams
69%
Oxide films
60%
Vanadium
60%
Infrared imaging
58%
Thin films
46%
Temperature
19%
Sputtering
15%
Imaging techniques
9%
Focal plane arrays
8%
Pressure control
7%
Partial pressure
7%
Real time control
6%
Electric properties
6%
Resistors
5%
Ions
5%
Oxygen
4%
Cameras
4%
Gases
3%
Hot Temperature
2%
Physics & Astronomy
vanadium oxides
65%
ion beams
38%
electrical resistivity
31%
coefficients
26%
thin films
25%
sputtering
9%
residual gas
7%
focal plane devices
7%
high resistance
6%
vanadium
6%
resistors
6%
grade
5%
partial pressure
5%
analyzers
5%
cameras
4%
direct current
4%
electrical properties
4%
oxygen
3%
sensitivity
3%
ions
2%
temperature
1%
energy
1%
Chemical Compounds
Infrared Imaging
72%
Vanadium Oxide
57%
Ion Beam
54%
Ion Beam Sputtering
11%
Liquid Film
10%
Sputtering
7%
Partial Pressure
6%
Electrical Property
5%
Alloy
4%
Resistance
4%
Gas
3%
Dioxygen
3%
Energy
3%
Ion
2%