High resolution and low-cost test technique for unpopulated MCM substrate

Keyphrases

• High-resolution 100%
• Multichip Modules 100%
• Low-cost Experiments 100%
• Interconnect Failure 100%
• Electron Beam 50%
• Attenuation 50%
• Multiple Probes 50%
• Resonator 50%
• Low-cost Method 50%
• Attenuation Measurement 50%
• Fault Coverage 50%
• Test Stimuli 50%
• Capacitance Technique 50%
• Electrical Module 50%

Medicine and Dentistry

• Health Care Cost 100%

Computer Science

• Fault Coverage 100%