High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation Of Common Defects In Scandium and Aluminum Alloyed β-Ga2O3

Andrew R. Balog; Leixin Miao; Saiphaneendra Bachu; Jani Jesenovec; Benjamin Dutton; John McCloy; Nasim Alem

doi:10.1093/micmic/ozad067.921

High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation Of Common Defects In Scandium and Aluminum Alloyed β-Ga2O3

Andrew R. Balog, Leixin Miao, Saiphaneendra Bachu, Jani Jesenovec, Benjamin Dutton, John McCloy, Nasim Alem

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1779-1780
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.921
State	Published - Jul 22 2023

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1093/micmic/ozad067.921

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@article{14935f3582b34e17ace04a2af460796a,

title = "High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation Of Common Defects In Scandium and Aluminum Alloyed β-Ga2O3",

author = "Balog, {Andrew R.} and Leixin Miao and Saiphaneendra Bachu and Jani Jesenovec and Benjamin Dutton and John McCloy and Nasim Alem",

year = "2023",

month = jul,

day = "22",

doi = "10.1093/micmic/ozad067.921",

language = "English (US)",

volume = "29",

pages = "1779--1780",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "1",

}

TY - JOUR

T1 - High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation Of Common Defects In Scandium and Aluminum Alloyed β-Ga2O3

AU - Balog, Andrew R.

AU - Miao, Leixin

AU - Bachu, Saiphaneendra

AU - Jesenovec, Jani

AU - Dutton, Benjamin

AU - McCloy, John

AU - Alem, Nasim

PY - 2023/7/22

Y1 - 2023/7/22

UR - http://www.scopus.com/inward/record.url?scp=85168561598&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85168561598&partnerID=8YFLogxK

U2 - 10.1093/micmic/ozad067.921

DO - 10.1093/micmic/ozad067.921

M3 - Article

C2 - 37613749

AN - SCOPUS:85168561598

SN - 1431-9276

VL - 29

SP - 1779

EP - 1780

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 1

ER -

High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation Of Common Defects In Scandium and Aluminum Alloyed β-Ga2O3

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