High resolution soft X-ray spectroscopy of M 87 with the reflection grating spectrometers on XMM - Newton

I. Sakelliou, J. R. Peterson, T. Tamura, F. B.S. Paerels, J. S. Kaastra, E. Belsole, H. Böhringer, G. Branduardi-Raymont, C. Ferrigno, J. W. Den Herder, J. Kennea, R. F. Mushotzky, W. T. Vestrand, D. M. Worrall

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