Abstract
We present a general strategy to increase the thermal stability of the hole transport layer in common small molecule OLEDs by >50°C without adversely affecting their electrical characteristics.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 565 |
| Number of pages | 1 |
| Journal | Digest of Technical Papers - SID International Symposium |
| Volume | 48 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2017 |
| Event | SID Symposium, Seminar, and Exhibition 2017, Display Week 2017 - Los Angeles, United States Duration: May 21 2017 → May 26 2017 |
All Science Journal Classification (ASJC) codes
- General Engineering