Abstract
Vertical GaN Schottky barrier diode (SBD) structures were grown by metal-organic chemical vapor deposition on free-standing GaN substrates. The carbon doping effect on SBD performance was studied by adjusting the growth conditions and spanning the carbon doping concentration between ≤3 × 1015 cm-3 and 3 × 1019 cm-3. Using the optimized growth conditions that resulted in the lowest carbon incorporation, a vertical GaN SBD with a 6-μm drift layer was fabricated. A low turn-on voltage of 0.77 V with a breakdown voltage over 800 V was obtained from the device.
Original language | English (US) |
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Article number | 062103 |
Journal | Applied Physics Letters |
Volume | 108 |
Issue number | 6 |
DOIs | |
State | Published - Feb 8 2016 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)