Highly accelerated lifetime testing of potassium sodium niobate thin films

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Highly accelerated lifetime tests of 2 and 3 μm thick potassium sodium niobate [(K0.5, Na0.5)NbO3, KNN] films with different thicknesses were measured under electric fields ranging from 160 to 350 kV/cm and temperatures ranging from 90 to 210 °C. The medium time to failure (t50) was determined from a lognormal distribution plot of failure times of up to 22 electrodes per measurement condition. The activation energy (Ea) for failure was 0.74 ± 0.04 eV and 0.92 ± 0.05 eV for the 2 μm and 3 μm KNN films, respectively. The voltage acceleration factor was 3.5 ± 0.34 for the 3 μm film. But the electric field dependence of t50 for the 2 μm film showed two regions with similar N, 6.67 and 6.94 ± 0.23, respectively. Energy-dispersive X-ray spectroscopy was employed to investigate the Na+ and K+ ion distributions in KNN films.

Original languageEnglish (US)
Article number212903
JournalApplied Physics Letters
Issue number21
StatePublished - Nov 20 2017

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


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