HREM investigation of (110) oriented YBa2Cu3O7 thin films deposited on (110) SrTiO3 substrates

J. W. Seo, Bernd C. Kabius, C. L. Jia, H. Soltner, U. Poppe, K. Urban

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The epitaxial growth and microstructure of YBa2Cu3O7 thin films on (110) SrTiO3 substrates was investigated by high-resolution electron microscopy. The single thin films and heterostructures with PrBa2Cu3O7 and SrTiO3 separating the superconductor layers were deposited by DC sputtering. All layers were grown with the [110] direction perpendicular to the substrate surface with the c-axis of the YBa2Cu3O7 film oriented parallel to the [001] direction of the substrate. Resistance measurements showed that, by applying a template growth procedure, Tc values of up to 85 K can be obtained. Stacking faults were found to be the dominant defect type in the superconducting film. A structural model for a novel type of these defects inducing a local 2-3-5 cation stoichiometry was deduced by comparison between experimental and simulated high-resolution images. Antiphase boundaries with a habit plane close to the (110) plane of YBa2Cu3O7 were detected.

Original languageEnglish (US)
Pages (from-to)158-166
Number of pages9
JournalPhysica C: Superconductivity and its applications
Issue number1-2
StatePublished - May 10 1994

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering


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