Abstract
The image of scanning electrochemical microscopy often contains some little bright details besides noise. The wavelet threshold is good at denoising, but cannot eliminate bright details. The math morphology is applied to polluted image for denoising and removing bright details, then the gotten image is processed using wavelet threshold. The effect of image-denoising is better, and the planar image can be converted into three dimensional image. This function is realized by adopting mixed programming between VC and Matlab and the code is simple.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 33-36 |
| Number of pages | 4 |
| Journal | Huagong Zidonghua Ji Yibiao/Control and Instruments in Chemical Industry |
| Volume | 33 |
| Issue number | 4 |
| State | Published - Aug 2006 |
All Science Journal Classification (ASJC) codes
- Control and Systems Engineering