Image restoration via phase-derived drift correction of movies of 2D crystals acquired with a CMOS direct electron detector

Agustin J. Avila-Sakar; Blake M. Milner; Fei Guo; Wen Jiang

doi:10.1017/S1431927614005868

Image restoration via phase-derived drift correction of movies of 2D crystals acquired with a CMOS direct electron detector

Agustin J. Avila-Sakar
, Blake M. Milner
, Fei Guo
, Wen Jiang

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	828-829
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614005868
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927614005868

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title = "Image restoration via phase-derived drift correction of movies of 2D crystals acquired with a CMOS direct electron detector",

author = "Avila-Sakar, \{Agustin J.\} and Milner, \{Blake M.\} and Fei Guo and Wen Jiang",

year = "2014",

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doi = "10.1017/S1431927614005868",

language = "English (US)",

volume = "20",

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journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Image restoration via phase-derived drift correction of movies of 2D crystals acquired with a CMOS direct electron detector

AU - Avila-Sakar, Agustin J.

AU - Milner, Blake M.

AU - Guo, Fei

AU - Jiang, Wen

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927947772

UR - https://www.scopus.com/pages/publications/84927947772#tab=citedBy

U2 - 10.1017/S1431927614005868

DO - 10.1017/S1431927614005868

M3 - Conference article

AN - SCOPUS:84927947772

SN - 1431-9276

VL - 20

SP - 828

EP - 829

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Image restoration via phase-derived drift correction of movies of 2D crystals acquired with a CMOS direct electron detector

All Science Journal Classification (ASJC) codes

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