TY - GEN
T1 - Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)
AU - Frank, Martin M.
AU - Li, Ning
AU - Rasch, Malte J.
AU - Jain, Shubham
AU - Chen, Ching Tzu
AU - Muralidhar, Ramachandran
AU - Han, Jin Ping
AU - Narayanan, Vijay
AU - Philip, Timothy M.
AU - Brew, Kevin
AU - Simon, Andrew
AU - Saraf, Iqbal
AU - Saulnier, Nicole
AU - Boybat, Irem
AU - Wozniak, Stanislaw
AU - Sebastian, Abu
AU - Narayanan, Pritish
AU - MacKin, Charles
AU - Chen, An
AU - Tsai, Hsinyu
AU - Burr, Geoffrey W.
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Among the emerging approaches for deep learning acceleration, compute-in-memory (CIM) in crossbar arrays, in conjunction with optimized digital computation and communication, is attractive for achieving high execution speeds and energy efficiency. Analog phase-change memory (PCM) is particularly promising for this purpose. However, resistance typically drifts, which can degrade deep learning accuracy over time. Herein, we first discuss drift and noise mitigation by integrating projection liners into analog mushroom-type PCM devices, as well as tradeoffs with dynamic range. We then study their impact on inference accuracy for the Transformer-based language model BERT. We find that accuracy loss after extended drift can be minimal with an optimized mapping of weights to cells comprising two pairs of liner PCM devices of varying significance. Finally, we address the impact of drift on energy consumption during inference through a combination of drift, circuit, and architecture simulations. For a range of typical drift coefficients, we show that the peak vector-matrix multiplication (VMM) energy efficiency of a recently proposed heterogeneous CIM accelerator in 14 nm technology can increase by 3% to 15% over the course of one day to ten years. For convolutional neural network (CNN), long short-term memory (LSTM) and Transformer benchmarks, the increase in sustained energy efficiency remains below 10%, being greatest for models dominated by analog computation. Longer VMM integration times increase the energy impact of drift.
AB - Among the emerging approaches for deep learning acceleration, compute-in-memory (CIM) in crossbar arrays, in conjunction with optimized digital computation and communication, is attractive for achieving high execution speeds and energy efficiency. Analog phase-change memory (PCM) is particularly promising for this purpose. However, resistance typically drifts, which can degrade deep learning accuracy over time. Herein, we first discuss drift and noise mitigation by integrating projection liners into analog mushroom-type PCM devices, as well as tradeoffs with dynamic range. We then study their impact on inference accuracy for the Transformer-based language model BERT. We find that accuracy loss after extended drift can be minimal with an optimized mapping of weights to cells comprising two pairs of liner PCM devices of varying significance. Finally, we address the impact of drift on energy consumption during inference through a combination of drift, circuit, and architecture simulations. For a range of typical drift coefficients, we show that the peak vector-matrix multiplication (VMM) energy efficiency of a recently proposed heterogeneous CIM accelerator in 14 nm technology can increase by 3% to 15% over the course of one day to ten years. For convolutional neural network (CNN), long short-term memory (LSTM) and Transformer benchmarks, the increase in sustained energy efficiency remains below 10%, being greatest for models dominated by analog computation. Longer VMM integration times increase the energy impact of drift.
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U2 - 10.1109/IRPS48203.2023.10117874
DO - 10.1109/IRPS48203.2023.10117874
M3 - Conference contribution
AN - SCOPUS:85160419340
T3 - IEEE International Reliability Physics Symposium Proceedings
BT - 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 61st IEEE International Reliability Physics Symposium, IRPS 2023
Y2 - 26 March 2023 through 30 March 2023
ER -