Impedance Corrected De-Embedding

Jason J. Ellison, Sedig S. Agili

Research output: Contribution to specialist publicationArticle

4 Scopus citations

Abstract

The 2x-thru, the most common standard used for creating fixture models, is never identical to the Fixture-DUT-Fixture due to printed circuit board (PCB) process variation. This difference leads to de-embedding error in the frequency and time domain. This paper introduces a method of impedance corrected de-embedding and its associated advantages. Impedance corrected de-embedding removes the error from differences between the Fixture-DUT-Fixture and reference 2x-thru impedance by implementing a peeling process. Further, the method is inherently more robust, because the fixture manufacturing tolerances do not impact the de-embedding results.

Original languageEnglish (US)
Pages45-48
Number of pages4
Volume11
No3
Specialist publicationIEEE Electromagnetic Compatibility Magazine
DOIs
StatePublished - 2022

All Science Journal Classification (ASJC) codes

  • Software
  • Signal Processing
  • Instrumentation
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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