Implications of technology scaling on leakage reduction techniques

Y. F. Tsai; D. Duarte; N. Vijaykrishnan; M. J. Irwin

doi:10.1145/775832.775880

Implications of technology scaling on leakage reduction techniques

Y. F. Tsai, D. Duarte, N. Vijaykrishnan, M. J. Irwin

Research output: Contribution to journal › Conference article › peer-review

28 Scopus citations

Abstract

The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limits and benefits, in terms of the potential leakage reduction, performance penalty, and area and power overhead in 0.25um, 0.18um, and 0.07um technologies. HSPICE simulation results and estimations with various functional units and memory structures are presented to support a comprehensive analysis.

Original language	English (US)
Pages (from-to)	187-190
Number of pages	4
Journal	Proceedings - Design Automation Conference
DOIs	https://doi.org/10.1145/775832.775880
State	Published - 2003
Event	Proceedings of the 40th Design Automation Conference - Anaheim, CA, United States Duration: Jun 2 2003 → Jun 6 2003

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Control and Systems Engineering

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title = "Implications of technology scaling on leakage reduction techniques",

abstract = "The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limits and benefits, in terms of the potential leakage reduction, performance penalty, and area and power overhead in 0.25um, 0.18um, and 0.07um technologies. HSPICE simulation results and estimations with various functional units and memory structures are presented to support a comprehensive analysis.",

author = "Tsai, {Y. F.} and D. Duarte and N. Vijaykrishnan and Irwin, {M. J.}",

year = "2003",

doi = "10.1145/775832.775880",

language = "English (US)",

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journal = "Proceedings - Design Automation Conference",

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note = "Proceedings of the 40th Design Automation Conference ; Conference date: 02-06-2003 Through 06-06-2003",

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T1 - Implications of technology scaling on leakage reduction techniques

AU - Tsai, Y. F.

AU - Duarte, D.

AU - Vijaykrishnan, N.

AU - Irwin, M. J.

PY - 2003

Y1 - 2003

N2 - The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limits and benefits, in terms of the potential leakage reduction, performance penalty, and area and power overhead in 0.25um, 0.18um, and 0.07um technologies. HSPICE simulation results and estimations with various functional units and memory structures are presented to support a comprehensive analysis.

AB - The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limits and benefits, in terms of the potential leakage reduction, performance penalty, and area and power overhead in 0.25um, 0.18um, and 0.07um technologies. HSPICE simulation results and estimations with various functional units and memory structures are presented to support a comprehensive analysis.

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M3 - Conference article

AN - SCOPUS:0043136768

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JO - Proceedings - Design Automation Conference

JF - Proceedings - Design Automation Conference

T2 - Proceedings of the 40th Design Automation Conference

Y2 - 2 June 2003 through 6 June 2003

ER -

Implications of technology scaling on leakage reduction techniques

Abstract

All Science Journal Classification (ASJC) codes

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