Impression and compression creep of SiAlON ceramics

K. M. Fox, J. R. Hellmann, E. C. Dickey, D. J. Green, D. L. Shelleman, R. L. Yeckley

Research output: Contribution to journalArticlepeer-review

17 Scopus citations


Concurrent impression and uniaxial compression creep studies were performed on three Yb-SiAlON materials. Stress exponents were approximately 1 in compression and 2 in impression. The higher stress exponents were due to the complex stress field in the impression creep test, which caused microstructural dilation. The dilated multi-grain junctions also became filled with additional intergranular glassy phase. Focused ion beam milling and in situ lift-out specimen preparation combined with transmission electron microscopy was successful in identifying microstructural changes after creep testing. These observations have important implications in the design of creep-resistant materials in complex stress fields.

Original languageEnglish (US)
Pages (from-to)2555-2563
Number of pages9
JournalJournal of the American Ceramic Society
Issue number8
StatePublished - Aug 2006

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Materials Chemistry


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