Improvement inconsistency of the metallic film thickness of computer connectors

Su Fen Yang, Dennis K.J. Lin, Tzu Chen Hung

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


The variation of the film thickness and associated increase in cost are vital problems to computer connector producers. However, no scientific adjustment method is currently available. Transfer function and engineering process control are proposed to adjust the production processes for improving the quality of the metallic film of the connectors and reducing the cost of production. The analyses of the confirmatory experiments from using the two proposed approaches show significant gains in quality improvement and cost reduction. Furthermore, the engineering process control approach reveals a better improvement over the transfer function approach. Thus this approach is recommended to improve the quality of the film thickness and reduce the production cost in the computer connector industry.

Original languageEnglish (US)
Pages (from-to)498-505
Number of pages8
JournalJournal of Process Control
Issue number3
StatePublished - Mar 2009

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Modeling and Simulation
  • Computer Science Applications
  • Industrial and Manufacturing Engineering


Dive into the research topics of 'Improvement inconsistency of the metallic film thickness of computer connectors'. Together they form a unique fingerprint.

Cite this