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Improving scratch-pad memory reliability through compiler-guided data block duplication
F. Li
, G. Chen
,
M. Kandemir
, I. Kolcu
Institute for Computational and Data Sciences (ICDS)
Computer Science and Engineering
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
14
Scopus citations
Overview
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Dive into the research topics of 'Improving scratch-pad memory reliability through compiler-guided data block duplication'. Together they form a unique fingerprint.
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Keyphrases
Compiler
100%
Scratchpad Memory
100%
Block Duplication
100%
Soft Error
80%
Duplication
20%
Error-correcting
20%
Embedded Systems
20%
On chip
20%
Hurt
20%
Recent Trends
20%
Process Technology
20%
Protection Mechanism
20%
Voltage Scaling
20%
Optimizing Compilers
20%
Transient Error
20%
Scaling Process
20%
Embedded Computing
20%
Power Saving Mechanism
20%
Operation State
20%
Parity Check
20%
Memory Component
20%
Computer Science
Scratchpad Memory
100%
Soft Error
80%
Optimizing Compiler
20%
Embedded Computing
20%
Protection Mechanism
20%
Memory Component
20%
Computer Hardware
20%
Embedded System
20%