Keyphrases
Laser-induced
100%
In Situ Detection
100%
Silicon Wafer Surface
100%
Induced Slip
100%
Slip Initiation
100%
Silicon Wafer
80%
Laser Beams
40%
Laser Irradiation
40%
Beam Irradiation
40%
Scattered Signal
40%
Surface Slip
40%
High-power Laser Beam
40%
Optical Microscope
20%
Laser Power
20%
In Situ Techniques
20%
Near-infrared
20%
Light Scattering
20%
Surface Morphology
20%
Engineering
Silicon Wafer
100%
Beam Irradiation
40%
Slip Surface
40%
Power Laser
40%
Laser Irradiation
40%
Sudden Increase
40%
Laser Power
20%
Continuous Wave
20%
Optical Microscope
20%
Surface Morphology
20%
Scattered Light
20%
Earth and Planetary Sciences
Real Time
100%
High Power Lasers
100%
Optical Microscope
50%
Continuous Radiation
50%
Physics
Laser Beams
100%
High Power Lasers
50%
Near Infrared
25%
Continuous Radiation
25%
Fiber Laser
25%