In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials

Ashley L. Gibb; Nasim Alem; Jian Hao Chen; Jim Ciston; Alex Zettl

doi:10.1017/S1431927614010587

In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials

Ashley L. Gibb, Nasim Alem, Jian Hao Chen, Jim Ciston, Alex Zettl

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1770-1771
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614010587
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927614010587

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@article{9df6855481b34639983ee42a48928c18,

title = "In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials",

author = "Gibb, {Ashley L.} and Nasim Alem and Chen, {Jian Hao} and Jim Ciston and Alex Zettl",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614010587",

language = "English (US)",

volume = "20",

pages = "1770--1771",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials

AU - Gibb, Ashley L.

AU - Alem, Nasim

AU - Chen, Jian Hao

AU - Ciston, Jim

AU - Zettl, Alex

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927940274&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84927940274&partnerID=8YFLogxK

U2 - 10.1017/S1431927614010587

DO - 10.1017/S1431927614010587

M3 - Conference article

AN - SCOPUS:84927940274

SN - 1431-9276

VL - 20

SP - 1770

EP - 1771

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials

All Science Journal Classification (ASJC) codes

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