In-situ TEM mechanical testing of nanocrystalline zirconium thin films

Baoming Wang, Vikas Tomar, Aman Haque

Research output: Contribution to journalArticlepeer-review

11 Scopus citations


Mechanical behavior of nanocrystalline zirconium thin films was investigated in-situ inside a transmission electron microscope (TEM). The yield stress measured for specimens with <10 nm grain size was around 450-500 MPa compared to the bulk value of 250-300 MPa. Similar grain size effects are seen on fracture stress and strain of about 0.9 GPa and 1.5-2% respectively. Using in-situ TEM, we demonstrate control of grain size in the specimens using electro-migration stress and temperature. The experimental results suggest that the critical grain size for inverse Hall-Petch type relationship in nanocrystalline hexagonal close packed metals could be around 15 nm.

Original languageEnglish (US)
Pages (from-to)105-108
Number of pages4
JournalMaterials Letters
StatePublished - Aug 1 2015

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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