In situ TEM studies of local transport and structure in nanoscale multilayer films

A. N. Chiaramonti; L. J. Thompson; W. F. Egelhoff; B. C. Kabius; A. K. Petford-Long

doi:10.1016/j.ultramic.2008.04.008

In situ TEM studies of local transport and structure in nanoscale multilayer films

A. N. Chiaramonti, L. J. Thompson, W. F. Egelhoff, B. C. Kabius, A. K. Petford-Long

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

This paper describes a novel technique for studying structure-transport correlations in nanoscale multilayer thin films. Here, local current-voltage characteristics from simplified magnetic tunnel junctions are measured in situ on cross-sectional transmission electron microscopy (TEM) samples and correlated directly with TEM images of the microstructure at the tunneling site. It is found that local variations in barrier properties can be detected by a point probe method, and that the tunneling barrier height and width can be extracted.

Original language	English (US)
Pages (from-to)	1529-1535
Number of pages	7
Journal	Ultramicroscopy
Volume	108
Issue number	12
DOIs	https://doi.org/10.1016/j.ultramic.2008.04.008
State	Published - Nov 2008

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/j.ultramic.2008.04.008

Cite this

@article{6ade214996b14d3d9f8da14caa2d95ef,

title = "In situ TEM studies of local transport and structure in nanoscale multilayer films",

abstract = "This paper describes a novel technique for studying structure-transport correlations in nanoscale multilayer thin films. Here, local current-voltage characteristics from simplified magnetic tunnel junctions are measured in situ on cross-sectional transmission electron microscopy (TEM) samples and correlated directly with TEM images of the microstructure at the tunneling site. It is found that local variations in barrier properties can be detected by a point probe method, and that the tunneling barrier height and width can be extracted.",

author = "Chiaramonti, {A. N.} and Thompson, {L. J.} and Egelhoff, {W. F.} and Kabius, {B. C.} and Petford-Long, {A. K.}",

note = "Funding Information: The electron microscopy and FIB sample preparation were accomplished at the Electron Microscopy Center for Materials Research at Argonne National Laboratory. The authors would like to thank J.M. Hiller for assisting with the FIB sample development and preparation. This manuscript has been created by UChicago Argonne, LLC, Operator of Argonne National Laboratory (Argonne). Argonne, a U.S. Department of Energy Office of Science Laboratory, is operated under Contract no. DE-AC02-06CH11357. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.",

year = "2008",

month = nov,

doi = "10.1016/j.ultramic.2008.04.008",

language = "English (US)",

volume = "108",

pages = "1529--1535",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "12",

}

TY - JOUR

T1 - In situ TEM studies of local transport and structure in nanoscale multilayer films

AU - Chiaramonti, A. N.

AU - Thompson, L. J.

AU - Egelhoff, W. F.

AU - Kabius, B. C.

AU - Petford-Long, A. K.

N1 - Funding Information: The electron microscopy and FIB sample preparation were accomplished at the Electron Microscopy Center for Materials Research at Argonne National Laboratory. The authors would like to thank J.M. Hiller for assisting with the FIB sample development and preparation. This manuscript has been created by UChicago Argonne, LLC, Operator of Argonne National Laboratory (Argonne). Argonne, a U.S. Department of Energy Office of Science Laboratory, is operated under Contract no. DE-AC02-06CH11357. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.

PY - 2008/11

Y1 - 2008/11

N2 - This paper describes a novel technique for studying structure-transport correlations in nanoscale multilayer thin films. Here, local current-voltage characteristics from simplified magnetic tunnel junctions are measured in situ on cross-sectional transmission electron microscopy (TEM) samples and correlated directly with TEM images of the microstructure at the tunneling site. It is found that local variations in barrier properties can be detected by a point probe method, and that the tunneling barrier height and width can be extracted.

AB - This paper describes a novel technique for studying structure-transport correlations in nanoscale multilayer thin films. Here, local current-voltage characteristics from simplified magnetic tunnel junctions are measured in situ on cross-sectional transmission electron microscopy (TEM) samples and correlated directly with TEM images of the microstructure at the tunneling site. It is found that local variations in barrier properties can be detected by a point probe method, and that the tunneling barrier height and width can be extracted.

UR - http://www.scopus.com/inward/record.url?scp=53249125128&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=53249125128&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2008.04.008

DO - 10.1016/j.ultramic.2008.04.008

M3 - Article

C2 - 18556122

AN - SCOPUS:53249125128

SN - 0304-3991

VL - 108

SP - 1529

EP - 1535

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 12

ER -

In situ TEM studies of local transport and structure in nanoscale multilayer films

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this