In situ transmission electron microscopy of transistor operation and failure

Keyphrases

• Catastrophic Failure 100%
• Failure Mechanism 100%
• In Situ Transmission Electron Microscopy 100%
• Self-heating 100%
• AlGaN-GaN 100%
• Transistor Control 100%
• Microscopy 50%
• Transmission Electron Microscope 50%
• Nanomaterials 50%
• Analytical Tools 50%
• Thermo-mechanical Stress 50%
• Buffer Layer 50%
• Interdiffusion 50%
• Damage Process 50%
• GaN HEMT 50%
• Performance Studies 50%
• Nanoscale Devices 50%
• Reliability Study 50%
• Metal-semiconductor-metal 50%
• Drain Voltage 50%
• In Situ Microscopy 50%

Engineering

• Failure Mechanism 100%
• Catastrophic Failure 100%
• Nanomaterial 50%
• Mechanical Stress 50%
• Interdiffusion 50%
• Buffer Layer 50%
• Damage Process 50%
• Reliability Study 50%
• Drain Voltage 50%

Material Science

• Transmission Electron Microscopy 100%
• Transistor 100%
• Nucleation 33%
• Electron Mobility 33%
• Buffer Layer 33%
• Mechanical Stress 33%