TY - JOUR
T1 - Increased Ʃ3 boundaries
T2 - Effects of friction stir and post heating on pure copper
AU - Chen, Nannan
AU - Khan, Haris Ali
AU - Li, Shenxi
AU - Li, Jingjing
N1 - Publisher Copyright:
© 2021 Elsevier Inc.
PY - 2021/6
Y1 - 2021/6
N2 - This research explored the mechanisms of increased electrical conductivity in pure copper (Cu) which was first joined with aluminum via micro friction stir blind riveted and then exposed to post heating. The increased Ʃ3 boundaries with reduced random grain boundaries are the main reason contributing for this improvement. In this research, microstructural characterization, resistance measurement, and hardness testing were performed at the stir zone (SZ) and thermomechanical affected zone (TMAZ) of Cu in as-fabricated and heat-treated joints. A ratio between the fraction of Ʃ3 boundaries to total fraction of Ʃ9 and Ʃ27 boundaries was introduced to confirm that the increases of Ʃ3 boundaries in TMAZ at 300 °C were caused by the twinning mechanism whereas were through the regeneration mechanism in the SZ (heated at both 300 °C and 500 °C) and TMAZ (heated at 500 °C). Although electrical conductivity was improved by this grain boundary engineering approach, the high-temperature heating caused a dramatic reduction in microhardness due to the substantial strain relief and grain growth.
AB - This research explored the mechanisms of increased electrical conductivity in pure copper (Cu) which was first joined with aluminum via micro friction stir blind riveted and then exposed to post heating. The increased Ʃ3 boundaries with reduced random grain boundaries are the main reason contributing for this improvement. In this research, microstructural characterization, resistance measurement, and hardness testing were performed at the stir zone (SZ) and thermomechanical affected zone (TMAZ) of Cu in as-fabricated and heat-treated joints. A ratio between the fraction of Ʃ3 boundaries to total fraction of Ʃ9 and Ʃ27 boundaries was introduced to confirm that the increases of Ʃ3 boundaries in TMAZ at 300 °C were caused by the twinning mechanism whereas were through the regeneration mechanism in the SZ (heated at both 300 °C and 500 °C) and TMAZ (heated at 500 °C). Although electrical conductivity was improved by this grain boundary engineering approach, the high-temperature heating caused a dramatic reduction in microhardness due to the substantial strain relief and grain growth.
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U2 - 10.1016/j.matchar.2021.111120
DO - 10.1016/j.matchar.2021.111120
M3 - Article
AN - SCOPUS:85104126927
SN - 1044-5803
VL - 176
JO - Materials Characterization
JF - Materials Characterization
M1 - 111120
ER -