Abstract
A sudden death test is a special case of a multiply censored life test wherein an equal number of randomly selected surviving items are removed from the test following the occurrence of each failure. Confidence limits for the Weibull-shape parameter and a Weibull percentile may be set with a sudden death sample, using the method of maximum likelihood. An expression is found for the medium ratio of theupper to lower 100 (1 — α) percent confidence limits for a Weibull percentile under either sudden death or conventional type-II censored testing. It is proposed that this ratio be used as a criterion for determining whether a given sudden death test is more precise than a given conventional test.
Original language | English (US) |
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Pages (from-to) | 177-179 |
Number of pages | 3 |
Journal | IEEE Transactions on Reliability |
Volume | R-19 |
Issue number | 4 |
DOIs | |
State | Published - Nov 1970 |
All Science Journal Classification (ASJC) codes
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering