Infrared conductivity of hole accumulation and depletion layers in (Ga,Mn)As- and (Ga,Be)As-based electric field-effect devices
- B. C. Chapler
- , S. MacK
- , L. Ju
- , T. W. Elson
- , B. W. Boudouris
- , E. Namdas
- , J. D. Yuen
- , A. J. Heeger
- , N. Samarth
- , M. Di Ventra
- , R. A. Segalman
- , D. D. Awschalom
- , F. Wang
- , D. N. Basov
Research output: Contribution to journal › Article › peer-review
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