Abstract
Summary form only given. The authors have fabricated InGaAs junction FETs with Nb source and drain electrodes with submicrometer spacings. The devices exhibit gate-controlled supercurrents as large as 8 mA/mm at 4.2 K. This value of controlled supercurrent is larger than any previously reported for superconducting field-effect devices. The channel material was n-type In0.53Ga0.47As, epitaxially grown by molecular beam epitaxy on InP substrates. Gate control was achieved using a p-n junction which was buried below the channel. This structure allowed the Nb superconductor to be deposited directly onto the freshly grown channel layer to insure a clean superconductor-semiconductor contact, which is essential for obtaining optimum superconducting properties. The superconducting electrodes were patterned by reactive ion etching.
Original language | English (US) |
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Pages (from-to) | 2628 |
Number of pages | 1 |
Journal | IEEE Transactions on Electron Devices |
Volume | 36 |
Issue number | 11 pt 1 |
State | Published - Nov 1989 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Physics and Astronomy (miscellaneous)