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InGaN/GaN double heterostructure laser with cleaved facets

  • D. Stocker
  • , E. F. Schubert
  • , W. Grieshaber
  • , K. S. Boutros
  • , J. S. Flynn
  • , R. P. Vaudo
  • , V. M. Phanse
  • , J. M. Redwing

Research output: Contribution to journalConference articlepeer-review

Abstract

Laser action is demonstrated in InGaN/GaN double heterostructures with cleaved facets. Hydride vapor phase epitaxy is used to grow a 10-μm-thick buffer layer of GaN on (0001) sapphire, and metal-organic vapor phase epitaxy is used to subsequently grow a GaN/In0.09Ga0.91N/GaN double heterostructure. One-mm-long cavities are produced by cleaving the structure along the (1 0 1̄ 0) plane of the sapphire substrate. A pulsed Nitrogen laser is used for optical excitation. At room temperature, the laser threshold occurs at an incident power density of 1.3 MW/cm2. Above threshold, the differential quantum efficiency increases by a factor of 34, the emission linewidth decreases to 13.5 meV, and the output becomes highly TE polarized.

Original languageEnglish (US)
Pages (from-to)122-127
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3284
DOIs
StatePublished - 1998
EventIn-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II - San Jose, CA, United States
Duration: Jan 26 1998Jan 28 1998

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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