@inproceedings{bdccd456270b49f7af2b4c5a9b4f6fa5,
title = "Interface traps in silicon carbide MOSFETs",
author = "Cochrane, {C. J.} and Lenahan, {P. M.} and Lelis, {A. J.}",
year = "2008",
doi = "10.1109/IRWS.2008.4796135",
language = "English (US)",
isbn = "9781424421954",
series = "IEEE International Integrated Reliability Workshop Final Report",
booktitle = "2008 IEEE International Integrated Reliability Workshop Final Report, IRW 2008",
note = "2008 IEEE International Integrated Reliability Workshop, IRW 2008 ; Conference date: 12-10-2008 Through 16-10-2008",
}