TY - GEN
T1 - Interfacial defect chemistry in metal oxides
T2 - 204th Electrochemical Society Fall Meeting
AU - Dickey, Elizabeth C.
AU - Yang, Gaiying
AU - Wang, Qinglei
AU - Randall, Clive A.
PY - 2006/7/20
Y1 - 2006/7/20
N2 - Complex impedance spectroscopy and analytical transmission electron microscopy are used in a complementary fashion to understand the local defect chemistry and electrical properties of grain boundaries and interfaces in metal-oxide ceramics. High spatial resolution chemical analysis, including energy dispersive x-ray spectroscopy and electron energy loss spectroscopy are performed to understand the structure and microchemistry of the individual components of the microstructure (i.e. grain interiors, grain boundaries and interfaces). By measuring the impedance response of the material as a function of temperature, we are able to isolate the contributions of each microstructural component to the net impedance response. These techniques have been utilized to study grain boundary segregation in TiO 2 and degradation mechanisms in BaTiO 3-based multilayer ceramic capacitors.
AB - Complex impedance spectroscopy and analytical transmission electron microscopy are used in a complementary fashion to understand the local defect chemistry and electrical properties of grain boundaries and interfaces in metal-oxide ceramics. High spatial resolution chemical analysis, including energy dispersive x-ray spectroscopy and electron energy loss spectroscopy are performed to understand the structure and microchemistry of the individual components of the microstructure (i.e. grain interiors, grain boundaries and interfaces). By measuring the impedance response of the material as a function of temperature, we are able to isolate the contributions of each microstructural component to the net impedance response. These techniques have been utilized to study grain boundary segregation in TiO 2 and degradation mechanisms in BaTiO 3-based multilayer ceramic capacitors.
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M3 - Conference contribution
AN - SCOPUS:33745945109
SN - 156677425X
SN - 9781566774253
T3 - Proceedings - Electrochemical Society
SP - 187
EP - 196
BT - Interfaces in Electronic Materials - Proceedings of the International Symposium
Y2 - 12 October 2003 through 16 October 2003
ER -