@article{ed1774d7fc8c4deb997aae3193848508,
title = "Introduction to the special issue on 2008 international integrated reliability workshop (IIRW)",
author = "Guoqiao Tao and Patrick Lenahan and Gaddi Haase and Chadwin Young and Alvin Strong",
year = "2009",
month = jun,
doi = "10.1109/TDMR.2009.2020526",
language = "English (US)",
volume = "9",
pages = "104--105",
journal = "IEEE Transactions on Device and Materials Reliability",
issn = "1530-4388",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",
}