Introduction to the Special Section of CVPR 2017

Yanxi Liu; James M. Rehg; Camillo J. Taylor; Ying Wu

doi:10.1109/TPAMI.2022.3201636

Introduction to the Special Section of CVPR 2017

Yanxi Liu
, James M. Rehg
, Camillo J. Taylor
, Ying Wu

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	8702-8703
Number of pages	2
Journal	IEEE Transactions on Pattern Analysis and Machine Intelligence
Volume	44
Issue number	12
DOIs	https://doi.org/10.1109/TPAMI.2022.3201636
State	Published - Dec 1 2022

All Science Journal Classification (ASJC) codes

Software
Computer Vision and Pattern Recognition
Computational Theory and Mathematics
Applied Mathematics
Artificial Intelligence

Access to Document

10.1109/TPAMI.2022.3201636

Cite this

@article{5b6eb3ead2bd4746b73ca18056002891,

title = "Introduction to the Special Section of CVPR 2017",

author = "Yanxi Liu and Rehg, \{James M.\} and Taylor, \{Camillo J.\} and Ying Wu",

year = "2022",

month = dec,

day = "1",

doi = "10.1109/TPAMI.2022.3201636",

language = "English (US)",

volume = "44",

pages = "8702--8703",

journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",

issn = "0162-8828",

publisher = "IEEE Computer Society",

number = "12",

}

TY - JOUR

T1 - Introduction to the Special Section of CVPR 2017

AU - Liu, Yanxi

AU - Rehg, James M.

AU - Taylor, Camillo J.

AU - Wu, Ying

PY - 2022/12/1

Y1 - 2022/12/1

UR - https://www.scopus.com/pages/publications/85142355261

UR - https://www.scopus.com/pages/publications/85142355261#tab=citedBy

U2 - 10.1109/TPAMI.2022.3201636

DO - 10.1109/TPAMI.2022.3201636

M3 - Editorial

AN - SCOPUS:85142355261

SN - 0162-8828

VL - 44

SP - 8702

EP - 8703

JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

IS - 12

ER -

Introduction to the Special Section of CVPR 2017

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Cite this