Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals

Chemical Compounds

• Secondary Ion 74%
• Depth Profiling 73%
• Photoionization 69%
• Guanine 57%
• Trehalose 37%
• Cluster Ion 35%
• Time-of-Flight Secondary Ion Mass Spectrometry 35%
• Ionization 23%
• Ion 23%
• Environment 16%
• Reaction Yield 11%
• Molecule 10%

Engineering & Materials Science

• Photoionization 100%
• Depth profiling 96%
• Ions 54%
• Thin films 27%
• Trehalose 27%
• Ion sources 22%
• Secondary ion mass spectrometry 22%
• Ionization 19%
• Erosion 14%
• Molecules 14%
• Dynamic models 11%
• Lasers 11%

Physics & Astronomy

• photoionization 56%
• guanines 41%
• ions 27%
• dynamic models 15%
• secondary ion mass spectrometry 15%
• thin films 15%
• ion sources 14%
• erosion 14%
• fluence 12%
• damage 10%
• ionization 10%
• profiles 7%
• molecules 7%
• lasers 6%