Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals

Keyphrases

• Sputtered Neutral 100%
• Guanine 100%
• Secondary Ion 100%
• Molecular Depth Profiling 100%
• Photoionization 100%
• C60+ 100%
• Strong Field 100%
• Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) 50%
• Dynamic Model 50%
• Depth Profile 50%
• Neutral Molecules 50%
• Chemical Damage 50%
• Trehalose 50%
• Ion Signal 50%
• Neutral Component 50%
• Organic Thin Films 50%
• Laser Photoionization 50%
• Cluster Ion Source 50%
• Damage Accumulation 50%
• Ion Fluence 50%
• Chemical Environment 50%
• Analytical Protocol 50%

Chemistry

• Depth Profiling 100%
• Photoionization 100%
• Liquid Film 66%
• Secondary Ion 66%
• Guanine 66%
• Time-of-Flight Secondary Ion Mass Spectrometry 33%
• Cluster Ion 33%
• Trehalose 33%