TY - GEN
T1 - Investigation of laser-induced material removal of stainless steel at the super-micron level
AU - Kern, Ludwig A.
AU - Reutzel, Edward William
AU - Sills, Christopher A.
PY - 2004/12/1
Y1 - 2004/12/1
N2 - There has been a good deal of research conducted regarding laser machining at the micron level and below, however the feasibility of scaling laser-induced material removal processes to the super-micron level with regard to cost and quality has not been thoroughly investigated. The experimental results of laser-induced material removal of stainless steel by pulsed CO2 and Q-switched Nd:YAG lasers are presented. Experiments include the machining of channels of 0.8 mm width by 0.8 mm depth using a 2 kW CO2 laser. The effects of assist gas type, assist gas direction relative to beam motion, beam mode, and multiple parameter processing are discussed. Material removal by drilling with a 10 W (average power) Q-switched Nd:YAG laser is also explored through experiments designed to test the scalability of processing parameters for a range of hole sizes. The results should be useful for analyzing material removal for features at the super-micron level.
AB - There has been a good deal of research conducted regarding laser machining at the micron level and below, however the feasibility of scaling laser-induced material removal processes to the super-micron level with regard to cost and quality has not been thoroughly investigated. The experimental results of laser-induced material removal of stainless steel by pulsed CO2 and Q-switched Nd:YAG lasers are presented. Experiments include the machining of channels of 0.8 mm width by 0.8 mm depth using a 2 kW CO2 laser. The effects of assist gas type, assist gas direction relative to beam motion, beam mode, and multiple parameter processing are discussed. Material removal by drilling with a 10 W (average power) Q-switched Nd:YAG laser is also explored through experiments designed to test the scalability of processing parameters for a range of hole sizes. The results should be useful for analyzing material removal for features at the super-micron level.
UR - https://www.scopus.com/pages/publications/85085774915
UR - https://www.scopus.com/pages/publications/85085774915#tab=citedBy
M3 - Conference contribution
SN - 0912035773
SN - 9780912035772
T3 - ICALEO 2004 - 23rd International Congress on Applications of Laser and Electro-Optics, Congress Proceedings
BT - ICALEO 2004 - 23rd International Congress on Applications of Laser and Electro-Optics, Congress Proceedings
T2 - ICALEO 2004 - 23rd International Congress on Applications of Laser and Electro-Optics
Y2 - 4 October 2004 through 7 October 2004
ER -