Investigations into the interactions of a MALDI matrix with organic thin films using C60+ SIMS depth profiling

Jordan O. Lerach, Selda Keskin, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


Molecular depth profiling of multilayer organic films is now an established protocol for cluster SIMS. This unique capability is exploited here to study the ionization mechanism associated with matrix-enhanced SIMS and possibly matrix-assisted laser desorption/ionization. Successful depth profiling experiments were performed on model bi-layer systems using 2,5-dihydroxybenzoic acid as the matrix with dipalmitoylphosphatidylcholine or phenylalanine. The interaction between the matrix and organic analyte is monitored at the interface of the films. Tri-layer films with D2O as a thin film sandwiched between the matrix and organic layers are also investigated to determine what role, if any, water plays during ionization. The results show successful depth profiles when taken at 90 K. Mixing is observed at the interfaces of the films due to primary ion bombardment, but this mixing does not recreate the conditions necessary for ionization enhancement.

Original languageEnglish (US)
Pages (from-to)67-69
Number of pages3
JournalSurface and Interface Analysis
Issue numberS1
StatePublished - Nov 1 2014

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


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