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Investigations of molecular depth profiling with dual beam sputtering
C. Lu, A. Wucher, N. Winograd
Chemistry
Materials Research Institute (MRI)
Research output
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Contribution to journal
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Article
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peer-review
1
Scopus citations
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Engineering & Materials Science
Depth profiling
100%
Sputtering
77%
Gold
65%
Ions
56%
Trehalose
55%
Multilayer films
46%
Barium
43%
Biological materials
40%
Monolayers
40%
Erosion
30%
Thin films
28%
Imaging techniques
23%
Experiments
10%
Chemical Compounds
Depth Profiling
76%
Sputtering
65%
Arachidate
49%
Langmuir-Blodgett Multilayer
46%
Trehalose
38%
Multilayer Film
35%
Molecular Ion
31%
Biomaterial
26%
Monolayer
22%
Liquid Film
14%
Ion
12%
Surface
9%
Physics & Astronomy
sputtering
47%
bombardment
42%
gold
23%
damage
21%
molecular ions
16%
profiles
16%
barium
15%
erosion
14%
surface layers
13%
fluence
12%
decay
8%
thin films
7%
ions
7%