Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles

Andreas Wucher; Lars Breuer; Nicholas Winograd

doi:10.1016/j.ijms.2018.12.007

Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles

Andreas Wucher, Lars Breuer, Nicholas Winograd

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Abstract

The formation probability of secondary ions released from a metal surface under bombardment with a 20-keV cluster ion beam is investigated using combined time-of-flight secondary ion and neutral mass spectrometry (Tof-SIMS/SNMS) experiments. The emitted neutral atoms and clusters are post-ionized after their ejection using strong-field photoionization in an intense short infrared laser pulse. Comparing the secondary ion signal with that of the corresponding neutral particles, the ionization probability of sputtered indium atoms and In_n clusters with n = 2–4 is determined. The results are compared between two different projectile cluster ions, namely i) C₆₀ ⁺ and ii) Ar_n ⁺ with n∼1000. It is shown that the ionization probability obtained with the fullerene cluster is by roughly a factor 4 larger than that obtained with the rare gas cluster, thereby indicating that there is no nonlinear enhancement of the transient electronic excitation generated by a cluster impact.

Original language	English (US)
Pages (from-to)	13-21
Number of pages	9
Journal	International Journal of Mass Spectrometry
Volume	438
DOIs	https://doi.org/10.1016/j.ijms.2018.12.007
State	Published - Apr 2019

All Science Journal Classification (ASJC) codes

Instrumentation
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/j.ijms.2018.12.007

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@article{a635827fe01c412e9663e7619e220d95,

title = "Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles",

abstract = "The formation probability of secondary ions released from a metal surface under bombardment with a 20-keV cluster ion beam is investigated using combined time-of-flight secondary ion and neutral mass spectrometry (Tof-SIMS/SNMS) experiments. The emitted neutral atoms and clusters are post-ionized after their ejection using strong-field photoionization in an intense short infrared laser pulse. Comparing the secondary ion signal with that of the corresponding neutral particles, the ionization probability of sputtered indium atoms and Inn clusters with n = 2–4 is determined. The results are compared between two different projectile cluster ions, namely i) C60 + and ii) Arn + with n∼1000. It is shown that the ionization probability obtained with the fullerene cluster is by roughly a factor 4 larger than that obtained with the rare gas cluster, thereby indicating that there is no nonlinear enhancement of the transient electronic excitation generated by a cluster impact.",

author = "Andreas Wucher and Lars Breuer and Nicholas Winograd",

note = "Funding Information: The authors acknowledge financial support of this research by the German Ministry of Science (BMBF) under grant 05K16PG1 “Ion induced materials modification and characterization” as well as the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) - Projektnummer 278162697 - SFB 1242. Publisher Copyright: {\textcopyright} 2018",

year = "2019",

month = apr,

doi = "10.1016/j.ijms.2018.12.007",

language = "English (US)",

volume = "438",

pages = "13--21",

journal = "International Journal of Mass Spectrometry",

issn = "1387-3806",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles

AU - Wucher, Andreas

AU - Breuer, Lars

AU - Winograd, Nicholas

N1 - Funding Information: The authors acknowledge financial support of this research by the German Ministry of Science (BMBF) under grant 05K16PG1 “Ion induced materials modification and characterization” as well as the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) - Projektnummer 278162697 - SFB 1242. Publisher Copyright: © 2018

PY - 2019/4

Y1 - 2019/4

N2 - The formation probability of secondary ions released from a metal surface under bombardment with a 20-keV cluster ion beam is investigated using combined time-of-flight secondary ion and neutral mass spectrometry (Tof-SIMS/SNMS) experiments. The emitted neutral atoms and clusters are post-ionized after their ejection using strong-field photoionization in an intense short infrared laser pulse. Comparing the secondary ion signal with that of the corresponding neutral particles, the ionization probability of sputtered indium atoms and Inn clusters with n = 2–4 is determined. The results are compared between two different projectile cluster ions, namely i) C60 + and ii) Arn + with n∼1000. It is shown that the ionization probability obtained with the fullerene cluster is by roughly a factor 4 larger than that obtained with the rare gas cluster, thereby indicating that there is no nonlinear enhancement of the transient electronic excitation generated by a cluster impact.

AB - The formation probability of secondary ions released from a metal surface under bombardment with a 20-keV cluster ion beam is investigated using combined time-of-flight secondary ion and neutral mass spectrometry (Tof-SIMS/SNMS) experiments. The emitted neutral atoms and clusters are post-ionized after their ejection using strong-field photoionization in an intense short infrared laser pulse. Comparing the secondary ion signal with that of the corresponding neutral particles, the ionization probability of sputtered indium atoms and Inn clusters with n = 2–4 is determined. The results are compared between two different projectile cluster ions, namely i) C60 + and ii) Arn + with n∼1000. It is shown that the ionization probability obtained with the fullerene cluster is by roughly a factor 4 larger than that obtained with the rare gas cluster, thereby indicating that there is no nonlinear enhancement of the transient electronic excitation generated by a cluster impact.

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U2 - 10.1016/j.ijms.2018.12.007

DO - 10.1016/j.ijms.2018.12.007

M3 - Article

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SN - 1387-3806

VL - 438

SP - 13

EP - 21

JO - International Journal of Mass Spectrometry

JF - International Journal of Mass Spectrometry

ER -

Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles

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