IoT metrology

Jeffrey Voas; Rick Kuhn; Phillip A. Laplante

doi:10.1109/MITP.2018.032501740

IoT metrology

Jeffrey Voas, Rick Kuhn, Phillip A. Laplante

Research output: Contribution to journal › Review article › peer-review

6 Scopus citations

Abstract

In the Internet of Things (IoT), what can we measure? The authors explore how the field of metrology might be applicable to the IoT.

Original language	English (US)
Pages (from-to)	6-10
Number of pages	5
Journal	IT Professional
Volume	20
Issue number	3
DOIs	https://doi.org/10.1109/MITP.2018.032501740
State	Published - May 1 2018

All Science Journal Classification (ASJC) codes

Software
Hardware and Architecture
Computer Science Applications

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10.1109/MITP.2018.032501740

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title = "IoT metrology",

abstract = "In the Internet of Things (IoT), what can we measure? The authors explore how the field of metrology might be applicable to the IoT.",

author = "Jeffrey Voas and Rick Kuhn and Laplante, {Phillip A.}",

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IoT metrology

Abstract

All Science Journal Classification (ASJC) codes

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