IoT metrology

Jeffrey Voas, Rick Kuhn, Phillip A. Laplante

Research output: Contribution to journalReview articlepeer-review

6 Scopus citations


In the Internet of Things (IoT), what can we measure? The authors explore how the field of metrology might be applicable to the IoT.

Original languageEnglish (US)
Pages (from-to)6-10
Number of pages5
JournalIT Professional
Issue number3
StatePublished - May 1 2018

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Science Applications


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