Is the concern for soft-error overblown?

Sandip Kundu, Rajesh Galivanche, Vijaykrishnan Narayanan, Rajesh Raina, Pia Sanda, Kaushik Roy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


Soft-Error caused by ionizing radiation has emerged as a cause for great concern. It is argued that with scaling of transistor feature size, soft-error rate will increase by orders of magnitude and special solutions will be needed to deal with this problem. However, anecdotal evidence suggests soft-error is not the leading cause of transient faults today; the power supply droop, unforeseen workloads, thermal hot spots, active voltage, frequency and temperature regulation related issues cause problems with far greater incidence. While a problem is a problem, is engineering focus on soft-error the right priority? Is soft-error likely to dominate transient faults in future? Should this become a central focus during design process?

Original languageEnglish (US)
Title of host publicationIEEE International Test Conference, Proceedings, ITC 2005
Number of pages1
StatePublished - 2005
EventIEEE International Test Conference, ITC 2005 - Austin, TX, United States
Duration: Nov 8 2005Nov 10 2005

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


OtherIEEE International Test Conference, ITC 2005
Country/TerritoryUnited States
CityAustin, TX

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics


Dive into the research topics of 'Is the concern for soft-error overblown?'. Together they form a unique fingerprint.

Cite this