TY - GEN
T1 - Is there a critical size in nano grained metals for ductile to brittle transition?
AU - Haque, Aman
AU - Saif, Taher
PY - 2004
Y1 - 2004
N2 - The role of grain size and boundaries in determining the mechanical behavior of metals, such as elasticity and yielding was investigated. A novel micro apparatus that allows uniaxial tensile testing of free standing nano scale metal specimens as thin as 30nm was developed. The stress-strain response of sputter deposited aluminum films with thickness 30-200nm with the corresponding grain size of 10-100nm was measured using the apparatus. The results show that as grain size is reduced from micro scale, a critical dimension is reached when the size is too small for dislocations to exist, but no small enough for grain boundary mechanisms to fully contribute to deformation.
AB - The role of grain size and boundaries in determining the mechanical behavior of metals, such as elasticity and yielding was investigated. A novel micro apparatus that allows uniaxial tensile testing of free standing nano scale metal specimens as thin as 30nm was developed. The stress-strain response of sputter deposited aluminum films with thickness 30-200nm with the corresponding grain size of 10-100nm was measured using the apparatus. The results show that as grain size is reduced from micro scale, a critical dimension is reached when the size is too small for dislocations to exist, but no small enough for grain boundary mechanisms to fully contribute to deformation.
UR - https://www.scopus.com/pages/publications/21244489636
UR - https://www.scopus.com/pages/publications/21244489636#tab=citedBy
U2 - 10.1115/nano2004-46097
DO - 10.1115/nano2004-46097
M3 - Conference contribution
AN - SCOPUS:21244489636
SN - 0791841774
SN - 9780791841778
T3 - Proceedings of the 3rd ASME Integrated Nanosystems Conference - Design, Synthesis, and Applications
SP - 93
EP - 94
BT - Proceedings of the 3rd ASME Integrated Nanosystems Conference - Design, Synthesis, and Applications
PB - American Society of Mechanical Engineers
T2 - 3rd ASME Integrated Nanosystems Conference - Design, Synthesis, and Applications
Y2 - 22 September 2004 through 24 September 2004
ER -