Iterative built-in testing and tuning of mixed-signal/RF systems

A. Chatterjee; D. Han; V. Natarajan; S. Devarakond; S. Sen; H. Choi; R. Senguttuvan; S. Bhattacharya; A. Goyal; D. Lee; M. Swaminathan

doi:10.1109/ICCD.2009.5413136

Iterative built-in testing and tuning of mixed-signal/RF systems

A. Chatterjee, D. Han, V. Natarajan, S. Devarakond, S. Sen, H. Choi, R. Senguttuvan, S. Bhattacharya, A. Goyal, D. Lee, M. Swaminathan

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Scopus citations

Abstract

Design and test of high-speed mixedsignal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, postmanufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune procedures. Such procedures create new challenges for manufacturing test and built-in self-test of advanced mixed-signal/RF systems. In this paper, key test challenges are discussed and promising solutions are presented in the hope that it will be possible to design, manufacture and test "truly self-healing" systems in the near future.

Original language	English (US)
Title of host publication	2009 IEEE International Conference on Computer Design, ICCD 2009
Pages	319-326
Number of pages	8
DOIs	https://doi.org/10.1109/ICCD.2009.5413136
State	Published - 2009
Event	2009 IEEE International Conference on Computer Design, ICCD 2009 - Lake Tahoe, CA, United States Duration: Oct 4 2009 → Oct 7 2009

Publication series

Name	Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
ISSN (Print)	1063-6404

Other

Other	2009 IEEE International Conference on Computer Design, ICCD 2009
Country/Territory	United States
City	Lake Tahoe, CA
Period	10/4/09 → 10/7/09

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/ICCD.2009.5413136

Cite this

Chatterjee, A., Han, D., Natarajan, V., Devarakond, S., Sen, S., Choi, H., Senguttuvan, R., Bhattacharya, S., Goyal, A., Lee, D., & Swaminathan, M. (2009). Iterative built-in testing and tuning of mixed-signal/RF systems. In 2009 IEEE International Conference on Computer Design, ICCD 2009 (pp. 319-326). Article 5413136 (Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors). https://doi.org/10.1109/ICCD.2009.5413136

@inproceedings{2be0fc5c6ce7460ca230520cb9193ab3,

title = "Iterative built-in testing and tuning of mixed-signal/RF systems",

abstract = "Design and test of high-speed mixedsignal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, postmanufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune procedures. Such procedures create new challenges for manufacturing test and built-in self-test of advanced mixed-signal/RF systems. In this paper, key test challenges are discussed and promising solutions are presented in the hope that it will be possible to design, manufacture and test {"}truly self-healing{"} systems in the near future.",

author = "A. Chatterjee and D. Han and V. Natarajan and S. Devarakond and S. Sen and H. Choi and R. Senguttuvan and S. Bhattacharya and A. Goyal and D. Lee and M. Swaminathan",

year = "2009",

doi = "10.1109/ICCD.2009.5413136",

language = "English (US)",

isbn = "9781424450282",

series = "Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors",

pages = "319--326",

booktitle = "2009 IEEE International Conference on Computer Design, ICCD 2009",

note = "2009 IEEE International Conference on Computer Design, ICCD 2009 ; Conference date: 04-10-2009 Through 07-10-2009",

}

Chatterjee, A, Han, D, Natarajan, V, Devarakond, S, Sen, S, Choi, H, Senguttuvan, R, Bhattacharya, S, Goyal, A, Lee, D & Swaminathan, M 2009, Iterative built-in testing and tuning of mixed-signal/RF systems. in 2009 IEEE International Conference on Computer Design, ICCD 2009., 5413136, Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors, pp. 319-326, 2009 IEEE International Conference on Computer Design, ICCD 2009, Lake Tahoe, CA, United States, 10/4/09. https://doi.org/10.1109/ICCD.2009.5413136

Iterative built-in testing and tuning of mixed-signal/RF systems. / Chatterjee, A.; Han, D.; Natarajan, V. et al.
2009 IEEE International Conference on Computer Design, ICCD 2009. 2009. p. 319-326 5413136 (Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Han, D.

AU - Natarajan, V.

AU - Devarakond, S.

AU - Sen, S.

AU - Choi, H.

AU - Senguttuvan, R.

AU - Bhattacharya, S.

AU - Goyal, A.

AU - Lee, D.

AU - Swaminathan, M.

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AB - Design and test of high-speed mixedsignal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, postmanufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune procedures. Such procedures create new challenges for manufacturing test and built-in self-test of advanced mixed-signal/RF systems. In this paper, key test challenges are discussed and promising solutions are presented in the hope that it will be possible to design, manufacture and test "truly self-healing" systems in the near future.

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Iterative built-in testing and tuning of mixed-signal/RF systems

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