Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties

Kazumi Kaneda; Youichi Mizuno; Niall J. Donnelly; Soonil Lee; Weiguo Qu; Clive A. Randall

doi:10.4028/www.scientific.net/KEM.485.43

Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties

Kazumi Kaneda, Youichi Mizuno, Niall J. Donnelly, Soonil Lee, Weiguo Qu, Clive A. Randall

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Re-oxidation is an important thermal process to minimize oxygen vacancies and produce high reliable Ni-MLCCs. The re-oxidation of these devices is then investigated with a series of "in-situ" impedance measurements between 400 and 500 °C in air. From the relative impedance change, chemical diffusion coefficients, associated activation energy and effective equivalent circuit model are determined. Those values were found to be reasonable compared with previous researchers' data. Moreover, the proposed effective equivalent circuit model successfully represents the real Ni-MLCC morphology. From transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS), it is found that the electrical properties and reliabilities of the Ni-MLCCs re-oxidized under different conditions are identical.

Original language	English (US)
Title of host publication	Electroceramics in Japan XIV
Pages	43-46
Number of pages	4
DOIs	https://doi.org/10.4028/www.scientific.net/KEM.485.43
State	Published - Jul 26 2011
Event	30th Electronics Division Meeting of the Ceramic Society of Japan - Tokyo, Japan Duration: Oct 29 2010 → Oct 30 2010

Publication series

Name	Key Engineering Materials
Volume	485
ISSN (Print)	1013-9826

Other

Other	30th Electronics Division Meeting of the Ceramic Society of Japan
Country/Territory	Japan
City	Tokyo
Period	10/29/10 → 10/30/10

All Science Journal Classification (ASJC) codes

General Materials Science
Mechanics of Materials
Mechanical Engineering

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10.4028/www.scientific.net/KEM.485.43

Cite this

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title = "Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties",

abstract = "Re-oxidation is an important thermal process to minimize oxygen vacancies and produce high reliable Ni-MLCCs. The re-oxidation of these devices is then investigated with a series of {"}in-situ{"} impedance measurements between 400 and 500 °C in air. From the relative impedance change, chemical diffusion coefficients, associated activation energy and effective equivalent circuit model are determined. Those values were found to be reasonable compared with previous researchers' data. Moreover, the proposed effective equivalent circuit model successfully represents the real Ni-MLCC morphology. From transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS), it is found that the electrical properties and reliabilities of the Ni-MLCCs re-oxidized under different conditions are identical.",

author = "Kazumi Kaneda and Youichi Mizuno and Donnelly, {Niall J.} and Soonil Lee and Weiguo Qu and Randall, {Clive A.}",

year = "2011",

month = jul,

day = "26",

doi = "10.4028/www.scientific.net/KEM.485.43",

language = "English (US)",

isbn = "9783037851821",

series = "Key Engineering Materials",

pages = "43--46",

booktitle = "Electroceramics in Japan XIV",

note = "30th Electronics Division Meeting of the Ceramic Society of Japan ; Conference date: 29-10-2010 Through 30-10-2010",

}

Kaneda, K, Mizuno, Y, Donnelly, NJ, Lee, S, Qu, W & Randall, CA 2011, Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties. in Electroceramics in Japan XIV. Key Engineering Materials, vol. 485, pp. 43-46, 30th Electronics Division Meeting of the Ceramic Society of Japan, Tokyo, Japan, 10/29/10. https://doi.org/10.4028/www.scientific.net/KEM.485.43

Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties. / Kaneda, Kazumi; Mizuno, Youichi; Donnelly, Niall J. et al.
Electroceramics in Japan XIV. 2011. p. 43-46 (Key Engineering Materials; Vol. 485).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties

AU - Kaneda, Kazumi

AU - Mizuno, Youichi

AU - Donnelly, Niall J.

AU - Lee, Soonil

AU - Qu, Weiguo

AU - Randall, Clive A.

PY - 2011/7/26

Y1 - 2011/7/26

N2 - Re-oxidation is an important thermal process to minimize oxygen vacancies and produce high reliable Ni-MLCCs. The re-oxidation of these devices is then investigated with a series of "in-situ" impedance measurements between 400 and 500 °C in air. From the relative impedance change, chemical diffusion coefficients, associated activation energy and effective equivalent circuit model are determined. Those values were found to be reasonable compared with previous researchers' data. Moreover, the proposed effective equivalent circuit model successfully represents the real Ni-MLCC morphology. From transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS), it is found that the electrical properties and reliabilities of the Ni-MLCCs re-oxidized under different conditions are identical.

AB - Re-oxidation is an important thermal process to minimize oxygen vacancies and produce high reliable Ni-MLCCs. The re-oxidation of these devices is then investigated with a series of "in-situ" impedance measurements between 400 and 500 °C in air. From the relative impedance change, chemical diffusion coefficients, associated activation energy and effective equivalent circuit model are determined. Those values were found to be reasonable compared with previous researchers' data. Moreover, the proposed effective equivalent circuit model successfully represents the real Ni-MLCC morphology. From transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS), it is found that the electrical properties and reliabilities of the Ni-MLCCs re-oxidized under different conditions are identical.

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BT - Electroceramics in Japan XIV

T2 - 30th Electronics Division Meeting of the Ceramic Society of Japan

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Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties

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