TY - JOUR
T1 - Lamb wave scattering analysis for reflector characterization
AU - Cho, Younho
AU - Hongcrholt, Derrick D.
AU - Rose, Joseph L.
N1 - Funding Information:
This study was supported by EPRI under contract No. 2687-14.
PY - 1997
Y1 - 1997
N2 - The potential use of guided waves for defect characterization is studied. The influence of defect shape and size on transmitted and reflected fields is considered. Using the hybrid boundary element technique, the reflection and transmission coefficients for selected guided wave modes are numerically calculated and compared to experimental data. Selecting the aspect ratio as a shape parameter for various defects, the transmission and reflection coefficients are measured for certain guided wave modes input to the defect. The influence of defect size is then studied by monitoring the transmission and reflection coefficients for defects of various shapes and depths. The studies presented indicate that defect characterization is possible if a proper mode selection criteria can be established. The suitable features related to transmission and reflection coefficient data can also be used for algorithm development and implementation purposes of defect characterization.
AB - The potential use of guided waves for defect characterization is studied. The influence of defect shape and size on transmitted and reflected fields is considered. Using the hybrid boundary element technique, the reflection and transmission coefficients for selected guided wave modes are numerically calculated and compared to experimental data. Selecting the aspect ratio as a shape parameter for various defects, the transmission and reflection coefficients are measured for certain guided wave modes input to the defect. The influence of defect size is then studied by monitoring the transmission and reflection coefficients for defects of various shapes and depths. The studies presented indicate that defect characterization is possible if a proper mode selection criteria can be established. The suitable features related to transmission and reflection coefficient data can also be used for algorithm development and implementation purposes of defect characterization.
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U2 - 10.1109/58.585189
DO - 10.1109/58.585189
M3 - Article
C2 - 18244100
AN - SCOPUS:0030781871
SN - 0885-3010
VL - 44
SP - 44
EP - 52
JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
IS - 1
ER -