Laser interferometer for the study of piezoelectric and electrostrictive strains

Qiming Zhang; W. Y. Pan; L. E. Cross

doi:10.1063/1.341027

Laser interferometer for the study of piezoelectric and electrostrictive strains

Qiming Zhang, W. Y. Pan, L. E. Cross

Electrical Engineering

Research output: Contribution to journal › Article › peer-review

165 Scopus citations

Abstract

A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low-frequency optical path-length drifting and the system is capable of resolving displacements of the order of 10^-3 Å. For the strain induced by domain switching, a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.

Original language	English (US)
Pages (from-to)	2492-2496
Number of pages	5
Journal	Journal of Applied Physics
Volume	63
Issue number	8
DOIs	https://doi.org/10.1063/1.341027
State	Published - Dec 1 1988

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.341027

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abstract = "A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low-frequency optical path-length drifting and the system is capable of resolving displacements of the order of 10-3 {\AA}. For the strain induced by domain switching, a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.",

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AU - Pan, W. Y.

AU - Cross, L. E.

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N2 - A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low-frequency optical path-length drifting and the system is capable of resolving displacements of the order of 10-3 Å. For the strain induced by domain switching, a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.

AB - A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low-frequency optical path-length drifting and the system is capable of resolving displacements of the order of 10-3 Å. For the strain induced by domain switching, a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.

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Laser interferometer for the study of piezoelectric and electrostrictive strains

Abstract

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