Leakage current characteristics and DC resistance degradation mechanisms in Nb doped PZT films
- Betul Akkopru-Akgun
- , Thorsten J. M.
- , Kosuke Tsuji
- , Ke Wang
- , Clive A. Randall
- , Michael T. Lanagan
- , Susan Trolier-Mckinstry
Research output: Contribution to journal › Article › peer-review
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