Fingerprint
Dive into the research topics of 'Leakage current characteristics and DC resistance degradation mechanisms in Nb doped PZT films'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Leakage current characteristics and DC resistance degradation mechanisms in Nb doped PZT films
Betul Akkopru-Akgun, Thorsten J. M., Kosuke Tsuji, Ke Wang, Clive A. Randall, Michael T. Lanagan, Susan Trolier-Mckinstry
Research output: Contribution to journal › Article › peer-review
11
Scopus
citations