Keyphrases
Flow Method
100%
Lifetime Reliability
100%
Design Flow
100%
Aging
50%
Temperature Effect
25%
Temperature Variation
25%
Performance Degradation
25%
Dielectric
25%
Voltage Dependence
25%
Failure Mechanism
25%
Low Power Techniques
25%
Electromigration
25%
Technology Scaling
25%
On-chip Power
25%
Average Lifetime
25%
Component Reliability
25%
Voltage Variation
25%
Temperature Impact
25%
Time-dependent Dielectric Breakdown
25%
Dependent Failure
25%
Electric Breakdown
25%
Interconnect Wire
25%
Flow Optimization
25%
Engineering
Field Programmable Gate Arrays
100%
Design Flow
100%
Interconnects
50%
Dielectrics
25%
Power Density
25%
Failure Mechanism
25%
Supply Voltage
25%
Performance Degradation
25%
Electromigration
25%
Computer Science
Performance Degradation
100%
Supply Voltage
100%