Abstract
For a circularly polarized plane wave incident normally on a chiral sculptured thin film (STF), we determined that light pressure per unit thickness on the film is high when the incident plane wave and the chiral STF are co-handed, the loss factor in the chiral STF is as low as possible, the wavelength is either the center-wavelength of the Bragg regime or close to it, and the ratio of the film thickness normalized by the period is moderately high.
Original language | English (US) |
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Pages (from-to) | 7-12 |
Number of pages | 6 |
Journal | Optik |
Volume | 119 |
Issue number | 1 |
DOIs | |
State | Published - Jan 7 2008 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering