Local Critical Current Measurements on (Bi,Pb)2Sr2Ca2Cu3Ox Tape with an Electromagnetic Probe

K. L. Telschow; T. K. O'Brien; M. T. Lanagan; D. Y. Kaufman

doi:10.1109/77.233910

Local Critical Current Measurements on (Bi,Pb)2Sr2Ca2Cu3Ox Tape with an Electromagnetic Probe

K. L. Telschow, T. K. O'Brien, M. T. Lanagan, D. Y. Kaufman

Research output: Contribution to journal › Letter › peer-review

3 Scopus citations

Abstract

The ability to measure critical currents in high Tc superconducting tapes on a local scale is valuable for optimizing the fabrication process. This paper describes the use of induced currents from a small noncontacting electromagnetic probe to determine the critical current density in a (Bi,Pb)2Sr2Ca2Cu3Ox/Ag tape on a local scale. The technique forces full field penetration into the tape locally and infers the critical current density from the Bean critical state model, accounting for the Ag overlayers. Critical current images of the tape can be obtained by scanning the probe over the tape surface with spatial resolution on the order of 1.0 mm. Results for tapes with different microstructures are discussed.

Original language	English (US)
Pages (from-to)	1643-1646
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	3
Issue number	1
DOIs	https://doi.org/10.1109/77.233910
State	Published - Mar 1993

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/77.233910

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@article{ca37150b9cc44a24ac0355bf0811581e,

title = "Local Critical Current Measurements on (Bi,Pb)2Sr2Ca2Cu3Ox Tape with an Electromagnetic Probe",

abstract = "The ability to measure critical currents in high Tc superconducting tapes on a local scale is valuable for optimizing the fabrication process. This paper describes the use of induced currents from a small noncontacting electromagnetic probe to determine the critical current density in a (Bi,Pb)2Sr2Ca2Cu3Ox/Ag tape on a local scale. The technique forces full field penetration into the tape locally and infers the critical current density from the Bean critical state model, accounting for the Ag overlayers. Critical current images of the tape can be obtained by scanning the probe over the tape surface with spatial resolution on the order of 1.0 mm. Results for tapes with different microstructures are discussed.",

author = "Telschow, {K. L.} and O'Brien, {T. K.} and Lanagan, {M. T.} and Kaufman, {D. Y.}",

note = "Funding Information: a. n i s wok was supported by the U.S. Department of Energy, Office of Energy Research, Office of Basic Energy Sciences, under DOE Idaho Field Office Contract DE-ACO7-76IDO1570 and Office of Conservation and Renewable Energy, as part of a DOE pmgram to develop electric power technology, under Contract No. W-31-109-Eng-38.M anuscript received August 24, 1992.",

year = "1993",

month = mar,

doi = "10.1109/77.233910",

language = "English (US)",

volume = "3",

pages = "1643--1646",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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AU - Telschow, K. L.

AU - O'Brien, T. K.

AU - Lanagan, M. T.

AU - Kaufman, D. Y.

N1 - Funding Information: a. n i s wok was supported by the U.S. Department of Energy, Office of Energy Research, Office of Basic Energy Sciences, under DOE Idaho Field Office Contract DE-ACO7-76IDO1570 and Office of Conservation and Renewable Energy, as part of a DOE pmgram to develop electric power technology, under Contract No. W-31-109-Eng-38.M anuscript received August 24, 1992.

PY - 1993/3

Y1 - 1993/3

N2 - The ability to measure critical currents in high Tc superconducting tapes on a local scale is valuable for optimizing the fabrication process. This paper describes the use of induced currents from a small noncontacting electromagnetic probe to determine the critical current density in a (Bi,Pb)2Sr2Ca2Cu3Ox/Ag tape on a local scale. The technique forces full field penetration into the tape locally and infers the critical current density from the Bean critical state model, accounting for the Ag overlayers. Critical current images of the tape can be obtained by scanning the probe over the tape surface with spatial resolution on the order of 1.0 mm. Results for tapes with different microstructures are discussed.

AB - The ability to measure critical currents in high Tc superconducting tapes on a local scale is valuable for optimizing the fabrication process. This paper describes the use of induced currents from a small noncontacting electromagnetic probe to determine the critical current density in a (Bi,Pb)2Sr2Ca2Cu3Ox/Ag tape on a local scale. The technique forces full field penetration into the tape locally and infers the critical current density from the Bean critical state model, accounting for the Ag overlayers. Critical current images of the tape can be obtained by scanning the probe over the tape surface with spatial resolution on the order of 1.0 mm. Results for tapes with different microstructures are discussed.

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Local Critical Current Measurements on (Bi,Pb)2Sr2Ca2Cu3Ox Tape with an Electromagnetic Probe

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