Local magnetic characterization of (Ga,Mn)As continuous thin film using scanning probe force microscopy

We report spatially resolved measurements of the saturation magnetization, anisotropy field, and g factor of a (Ga,Mn)As thin film using two different scanning probe techniques: ferromagnetic resonance force microscopy and probe-induced magnetic force microscopy. We find that the magnetic properties of the film are uniform within our 1-μm lateral resolution. We further demonstrate that these two powerful and complementary magnetic characterization approaches, the former dynamic and the latter static, obtain measurements of magnetic properties that are in excellent agreement with one another, enabling enhanced quantitative reliability.