Abstract
Polarization switching in polycrystalline ferroelectric capacitors is explored using piezoresponse force microscopy (PFM) based first-order reversal curve (FORC) measurements. The band excitation method facilitates decoupling the electromechanical responses from variations in surface elastic properties. A simulated annealing method is developed to estimate the Preisach densities from PFM FORC data. Microscopic and macroscopic Preisach densities are compared, illustrating good agreement between the two.
| Original language | English (US) |
|---|---|
| Article number | 112906 |
| Journal | Applied Physics Letters |
| Volume | 96 |
| Issue number | 11 |
| DOIs | |
| State | Published - 2010 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
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